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Advances in Metrology for X-Ray and Euv Optics: 2-3 August, 2005, San Diego, California, USA - Society Of Photo-Optical Instrumentation, Peter Z. Takacs, John S. Taylor
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Advances in Metrology for X-Ray and Euv Optics: 2-3 August, 2005, San Diego, California, USA
Format: paperback
ISBN: 9780819459268 (0819459267)
Edition language: English
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Books by Society Of Photo-Optical Instrumentation
Books by John S. Taylor
Books by Peter Z. Takacs
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