logo
Wrong email address or username
Wrong email address or username
Incorrect verification code
Learning from Good and Bad Data (The Springer International Series in Engineering and Computer Science) - Philip D. Laird
Learning from Good and Bad Data (The Springer International Series in Engineering and Computer Science)
by: (author)
Format: kindle
ASIN: B00FBHXA3Q
Publisher: Springer
Pages no: 212
Edition language: English
Bookstores:
Other editions (1)
Books by Philip D. Laird
Share this Book
Need help?