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Reliability, Packaging, Testing, and Characterization of Mems/Moems IV: 24-25 January 2005, San Jose, California, USA - Sandia National Laboratories, Danelle M. Tanner, Rajeshuni Ramesham
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Reliability, Packaging, Testing, and Characterization of Mems/Moems IV: 24-25 January 2005, San Jose, California, USA
by: (author) (author) (author)
Format: hardcover
ISBN: 9780819456908 (081945690X)
Publisher: SPIE-International Soc..." />
Pages no: 220
Edition language: English
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