logo
Wrong email address or username
Wrong email address or username
Incorrect verification code
Testing For Small Delay Defects In Nanoscale Cmos Integrated Circuits - Krishnendu Chakrabarty, Sandeep Kumar Goel, Sandeep K. Goel
Testing For Small Delay Defects In Nanoscale Cmos Integrated Circuits
Format: hardcover
ISBN: 9781439829417 (1439829411)
Publisher: CRC Press
Pages no: 259
Edition language: English
Bookstores:
Books by Krishnendu Chakrabarty
Books by Sandeep Kumar Goel
Books by Sandeep K. Goel
Share this Book
Need help?