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2010 25th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems: DFT 2010: Proceedings, 6-8 October 2010, Kyoto, Kyoto, Japan - Institute of Electrical and Electronics Engineers, Inc.
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2010 25th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems: DFT 2010: Proceedings, 6-8 October 2010, Kyoto, Kyoto, Japan
by: (author)
Format: hardcover
ISBN: 9780769542430 (0769542433)
Publisher: IEEE Computer Society Press
Pages no: 449
Edition language: English
Bookstores:
Books by Institute of Electrical and Electronics Engineers, Inc.
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