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21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems: Proceedings: Arlington, Virginia, USA, October 4-6, 2006 - Institute of Electrical and Electronics Engineers, Inc.
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21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems: Proceedings: Arlington, Virginia, USA, October 4-6, 2006
by: (author)
Format: hardcover
ISBN: 9780769527062 (076952706X)
Publisher: IEEE Computer Society Press
Pages no: 583
Edition language: English
Bookstores:
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