logo
Wrong email address or username
Wrong email address or username
Incorrect verification code

Aland K. Chin's Books back

language per page order
Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.) - Aland K. Chin, S.C. Wang, Niloy K. Dutta, Kurt J. Linden
Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--the International Society for Optical Engineering, V. 4285.)
by Niloy K. Dutta (author), Kurt J. Linden (author), Aland K. Chin (author), S.C. Wang (author)
format: paperback pages: 246
ISBN: 0819439630 (9780819439635)
Test And Measurement Applications Of Optoelectronic Devices: 21 22 January 2002, San Jose, Usa - Aland K. Chin
Test And Measurement Applications Of Optoelectronic Devices: 21 22 January 2002, San Jose, Usa
by Aland K. Chin (author)
ISBN: 0819443875 (9780819443878)
Copyright © 2024 BookLikes Press About Terms of Services Privacy Policy Contact Us Blog FAQ Patronaty medialne BookLikes for Authors Partners panel Team Themes Docs API Blogs
Need help?
Important: Our sites use cookies. We use the information stored using cookies and similar technologies for advertising and statistics purposes. Stored data allow us to tailor the websites to individual user's interests. Cookies may be also used by third parties cooperating with BookLikes, like advertisers, research companies and providers of multimedia applications. You can choose how cookies are handled by your device via your browser settings. If you choose not to receive cookies at any time, BookLikes will not function properly and certain services will not be provided. For more information, please go to our Privacy Policy.