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High Resolution X-Ray Diffractometry and Topography - D.K. Bowen, Brian K. Tanner, Keith D. Bowen
High Resolution X-Ray Diffractometry and Topography
by: (author) (author) (author)
Format: hardcover
ISBN: 9780850667585 (0850667585)
Publisher: CRC Press
Pages no: 264
Edition language: English
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Other editions (1)
Books by D.K. Bowen
Books by Brian K. Tanner
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