ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery [With CDROM]
Format: paperback
ISBN:
9780871708632 (0871708639)
Publish date: January 1st 2007
Publisher: ASM International(OH)
Pages no: 356
Edition language: English