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Jeffrey Laroche's Books back

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Performance and Reliability of Semiconductor Devices: Volume 1108 - Michael Mastro, Jeffrey Laroche, Fan Ren, Jen-Inn Chyi, Jihyun Kim
Performance and Reliability of Semiconductor Devices: Volume 1108
by Michael Mastro (author), Fan Ren (author), Jihyun Kim (author), Jen-Inn Chyi (author), Jeffrey Laroche (author)
format: paperback pages: 278
ISBN: 1107408490 (9781107408494)
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