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Pore characterization of ultralow-k dielectric thin films using positronium annihilation spectroscopy. - Ming Liu
Pore characterization of ultralow-k dielectric thin films using positronium annihilation spectroscopy.
by: (author)
Format: NOOKstudy eTextbook
ISBN: 9780549986751 (0549986758)
Publisher: ProQuest LLC
Pages no: 246
Edition language: English
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Books by Ming Liu
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