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Proceedings of the 15th Asian Test Symposium: 20-23 November 2006, Fukuoka, Japan - Institute of Electrical and Electronics Engineers, Inc.
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Proceedings of the 15th Asian Test Symposium: 20-23 November 2006, Fukuoka, Japan
by: (author)
Format: hardcover
ISBN: 9780769526287 (0769526284)
Publisher: IEEE Computer Society Press
Pages no: 451
Edition language: English
Bookstores:
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