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The Changing Philosophy of Test: International Test Conference, 1990 Proceedings: September 10-14, 1990, Sheraton Washington Hotel, Washington, DC - Institute of Electrical and Electronics Engineers, Inc.
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The Changing Philosophy of Test: International Test Conference, 1990 Proceedings: September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
by: (author)
Format: hardcover
ISBN: 9780818690648 (081869064X)
Publisher: IEEE Computer Society Press
Pages no: 1083
Edition language: English
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