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Vast, IEEE Symposium on Visual Analytics Science and Technology, 2006: Proceedings, Baltimore, Maryland, USA, October 31-November 2, 2006 - Siggraph
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Vast, IEEE Symposium on Visual Analytics Science and Technology, 2006: Proceedings, Baltimore, Maryland, USA, October 31-November 2, 2006
by: (author)
Format: hardcover
ISBN: 9781424405916 (1424405912)
Publisher: IEEE Computer Society Press
Pages no: 216
Edition language: English
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