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Advances in X-Ray Analysis - Gilfrich, Ron Jenkins, Deane K. Smith, Ting C. Huang, M.R. James, Gilfrich
Advances in X-Ray Analysis
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Format: hardcover
ISBN: 9780306445712 (0306445719)
Publisher: Kluwer Academic Publishers
Pages no: 710
Edition language: English
Bookstores:
Books by M.R. James
Books by Ron Jenkins
Books by Gilfrich
Books by Gilfrich
Books by Deane K. Smith
Books by Ting C. Huang
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