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Christoph Genzel's Books back

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Thin Film Analysis by X-Ray Scattering - Mario Birkholz, Paul F. Fewster, Christoph Genzel
Thin Film Analysis by X-Ray Scattering
by Mario Birkholz (author), Paul F. Fewster (author), Christoph Genzel (author)
publisher: Wiley-VCH Verlag GmbH publish date: February 1st 2006
format: hardcover pages: 356
language: English
ISBN: 3527310525 (9783527310524)
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