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Thin Film Analysis by X-Ray Scattering - Mario Birkholz, Paul F. Fewster, Christoph Genzel
Thin Film Analysis by X-Ray Scattering
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Format: hardcover
ISBN: 9783527310524 (3527310525)
Publisher: Wiley-VCH Verlag GmbH
Pages no: 356
Edition language: English
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Other editions (2)
Books by Mario Birkholz
Books by Paul F. Fewster
Books by Christoph Genzel
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