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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155 - Alexander A Demkov, Bill Taylor, H Rusty Harris, Jeffery W Butterbaugh, Willy Rachmady
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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155
by: (author) (author) (author) (author) (author)
Format: paperback
ISBN: 9781107408326 (1107408326)
Pages no: 194
Edition language: English
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Books by Bill Taylor
Books by Alexander A Demkov
Books by H Rusty Harris
Books by Jeffery W Butterbaugh
Books by Willy Rachmady
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