logo
Wrong email address or username
Wrong email address or username
Incorrect verification code

David G. Seiler's Books back

language per page order
Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano - David G. Seiler
Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano
by David G. Seiler (author)
publisher: American Institute of Physics publish date: September 1st 2007
format: hardcover pages: 578
language: English
ISBN: 0735404410 (9780735404410)
Hot Electrons in Semiconductors: Proceedings of the International Conference on Hot Electrons in Semiconductors Held in Denton, Texas, 6-8 July 1977 - David G. Seiler
Hot Electrons in Semiconductors: Proceedings of the International Conference on Hot Electrons in Semiconductors Held in Denton, Texas, 6-8 July 1977
by David G. Seiler (author)
publisher: Pergamon
format: hardcover pages: 323
language: English
ISBN: 0080226922 (9780080226927)
Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology [With CDROM] - David G. Seiler
Characterization and Metrology for ULSI Technology: 2003 International Conference on Characterization and Metrology for ULSI Technology [With CDROM]
by David G. Seiler (author)
publisher: American Institute of Physics publish date: October 8th 2003
format: hardcover pages: 818
language: English
ISBN: 0735401527 (9780735401525)
Optical Characterization in Microelectronics Manufacturing - Sidney Perkowitz, David G. Seiler
Optical Characterization in Microelectronics Manufacturing
by Sidney Perkowitz (author), David G. Seiler (author)
publisher: Diane Pub Co publish date: June 1st 1994
format: paperback pages: 34
ISBN: 0788115391 (9780788115394)
Frontiers of Characterization and Metrology for Nanoelectronics: 2011 - David G. Seiler, Alain C. Diebold, Robert McDonald
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
by Robert McDonald (author), David G. Seiler (author), Alain C. Diebold (author)
publisher: American Institute of Physics publish date: April 26th 2012
format: hardcover pages: 390
language: English
ISBN: 0735409730 (9780735409736)
Characterization and Metrology for ULSI Technology: 1998 International Conference; Gaithersburg, Maryland March 1998 [With CDROM] - David G. Seiler
Characterization and Metrology for ULSI Technology: 1998 International Conference; Gaithersburg, Maryland March 1998 [With CDROM]
by David G. Seiler (author)
publisher: American Institute of Physics publish date: December 14th 1998
format: hardcover pages: 960
language: English
ISBN: 1563967537 (9781563967535)
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nano - David G. Seiler, Rajinder P. Khosla, Dan Herr, Robert McDonald, Alain C. Diebold, C. Michael Garner
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nano
by Robert McDonald (author), David G. Seiler (author), Dan Herr (author), Alain C. Diebold (author), Rajinder P. Khosla (author), C. Michael Garner (author)
publisher: American Institute of Physics publish date: October 26th 2009
format: hardcover pages: 398
language: English
ISBN: 0735407126 (9780735407121)
Copyright © 2025 BookLikes Press About Terms of Services Privacy Policy Contact Us Blog FAQ Patronaty medialne BookLikes for Authors Partners panel Team Themes Docs API Blogs
Need help?
Important: Our sites use cookies. We use the information stored using cookies and similar technologies for advertising and statistics purposes. Stored data allow us to tailor the websites to individual user's interests. Cookies may be also used by third parties cooperating with BookLikes, like advertisers, research companies and providers of multimedia applications. You can choose how cookies are handled by your device via your browser settings. If you choose not to receive cookies at any time, BookLikes will not function properly and certain services will not be provided. For more information, please go to our Privacy Policy.