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Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nano - David G. Seiler, Rajinder P. Khosla, Dan Herr, Robert McDonald, Alain C. Diebold, C. Michael Garner
Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nano
by: (author) (author) (author) (author) (author) (author)
Format: hardcover
ISBN: 9780735407121 (0735407126)
Publisher: American Institute of Physics
Pages no: 398
Edition language: English
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Frontiers of Characterization and Metrology for Nanoelectronics: 2009 International Conference on Frontiers of Characterization and Metrology for Nano - David G. Seiler, Rajinder P. Khosla, Dan Herr, Robert McDonald, Alain C. Diebold, C. Michael Garner
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