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David M. Kranz's Books back

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Foundations Of Measurement, Volume II: Geometrical, Threshold, and Probabilistic Representations (Foundations of Measurement, #2) - Patrick C. Suppes, David M. Kranz, R. Duncan Luce, Amos Tversky
Foundations Of Measurement, Volume II: Geometrical, Threshold, and Probabilistic Representations (Foundations of Measurement, #2)
by R. Duncan Luce (author), Amos Tversky (author), Patrick C. Suppes (author), David M. Kranz (author)
publisher: Academic Press publish date: 1989
format: hardcover pages: 492
language: English
ISBN: 0124254020 (9780124254022)
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