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Foundations Of Measurement, Volume II: Geometrical, Threshold, and Probabilistic Representations (Foundations of Measurement, #2) - Patrick C. Suppes, David M. Kranz, R. Duncan Luce, Amos Tversky
Foundations Of Measurement, Volume II: Geometrical, Threshold, and Probabilistic Representations (Foundations of Measurement, #2)
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Format: hardcover
ISBN: 9780124254022 (0124254020)
Publisher: Academic Press
Pages no: 492
Edition language: English
Series: Foundations of Measurement
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Other editions (1)
Books by R. Duncan Luce
Books by Amos Tversky
Books by Patrick C. Suppes
Books by David M. Kranz
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