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Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry) (Nato Science Series II: (closed)) - Evgeni Gusev
Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry) (Nato Science Series II: (closed))
by: (author)
Format: kindle
ASIN: B000TB8JVW
Publisher: Springer
Pages no: 492
Edition language: English
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