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Gilfrich's Books back

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Advances in X-Ray Analysis - Gilfrich, Ron Jenkins, Deane K. Smith, Ting C. Huang, M.R. James, Gilfrich
Advances in X-Ray Analysis
by M.R. James (author), Ron Jenkins (author), Gilfrich (author), Gilfrich (author), Deane K. Smith (author), Ting C. Huang (author)
publisher: Kluwer Academic Publishers publish date: August 1st 1993
format: hardcover pages: 710
language: English
ISBN: 0306445719 (9780306445712)
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