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High Resolution X-Ray Diffractometry and Topography - editions back

by D.K. Bowen, B.K. Tanner
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High Resolution X-Ray Diffractometry and Topography - D.K. Bowen, B.K. Tanner
High Resolution X-Ray Diffractometry and Topography
by D.K. Bowen (author), B.K. Tanner (author)
publisher: Taylor & Francis, Inc. publish date: February 5th 1998
format: ebook
language: English
ISBN: 0203979192 (9780203979198)
High Resolution X-Ray Diffractometry and Topography - D.K. Bowen, Brian K. Tanner, Keith D. Bowen
High Resolution X-Ray Diffractometry and Topography
by D.K. Bowen (author), Brian K. Tanner (author), Keith D. Bowen (author)
publisher: CRC Press publish date: February 1st 1998
format: hardcover pages: 264
language: English
ISBN: 0850667585 (9780850667585)
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