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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach - Lall, Michael G. Pecht, Lall
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
by: (author) (author) (author)
Format: hardcover
ISBN: 9780849394508 (0849394503)
Publisher: CRC Press
Pages no: 336
Edition language: English
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Books by Michael G. Pecht
Books by Lall
Books by Lall
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