Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
by:
Michael G. Pecht (author)
Lall (author)
Lall (author)
Format: hardcover
ISBN:
9780849394508 (0849394503)
Publish date: April 24th 1997
Publisher: CRC Press
Pages no: 336
Edition language: English