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Jeffery W Butterbaugh's Books back

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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155 - Alexander A Demkov, Bill Taylor, H Rusty Harris, Jeffery W Butterbaugh, Willy Rachmady
CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155
by Bill Taylor (author), Alexander A Demkov (author), H Rusty Harris (author), Jeffery W Butterbaugh (author), Willy Rachmady (author)
format: paperback pages: 194
ISBN: 1107408326 (9781107408326)
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