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Lean Enterprise Value: Insights from MIT's Lean Aerospace Initiative - Earll Murman, Tom Allen, Joel Cutcher-Gershenfeld
Lean Enterprise Value: Insights from MIT's Lean Aerospace Initiative
by: (author) (author) (author)
Format: hardcover
ISBN: 9780333976975 (0333976975)
ASIN: 333976975
Publisher: Palgrave MacMillan
Pages no: 360
Edition language: English
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Other editions (1)
Books by Joel Cutcher-Gershenfeld
Books by Tom Allen
Books by Earll Murman
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