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Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy - José A. Gutierrez, Brian S.R. Armstrong
Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy
Format: hardcover
ISBN: 9781846289125 (1846289122)
Publisher: Springer
Pages no: 162
Edition language: English
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Other editions (3)
Books by José A. Gutierrez
Books by Brian S.R. Armstrong
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