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The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings : November 13-15, 1995 Lafayette, Louisiana - Institute of Electrical and Electronics Engineers, Inc.
The IEEE International Workshop on Defect and Fault Tolerance in Vlsi Systems: Proceedings : November 13-15, 1995 Lafayette, Louisiana
by: (author)
Format: hardcover
ISBN: 9780818671074 (0818671076)
Publisher: IEEE Computer ..." />
Pages no: 305
Edition language: English
Bookstores:
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