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Thin Film Analysis by X-Ray Scattering - Mario Birkholz
Thin Film Analysis by X-Ray Scattering
by: (author)
Format: ebook
ISBN: 9781280854125 (128085412X)
Publisher: Wiley-VCH Verlag GmbH
Pages no: 380
Edition language: English
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Other editions (2)
Books by Mario Birkholz
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