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Wojciech Maly's Books back

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) - Jitendra B. Khare, Wojciech Maly
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
by Wojciech Maly (author), Jitendra B. Khare (author)
publisher: Springer publish date: April 30th 1996
format: kindle pages: 168
language: English
ASIN: B000PC1250
VLSI Design for Manufacturing: Yield Enhancement - Wojciech Maly
VLSI Design for Manufacturing: Yield Enhancement
by Wojciech Maly (author)
publisher: Springer, 308 pages, Hardcover" /> publish date: November 30th 1989
format: hardcover pages: 308
language: English
ISBN: 0792390547 (9780792390541)
VLSI Design for Manufacturing: Yield Enhancement - Stephen W Director, Wojciech Maly, Andrzej J Strojwas
VLSI Design for Manufacturing: Yield Enhancement
by Wojciech Maly (author), Stephen W Director (author), Andrzej J Strojwas (author)
publisher: Springer, 308 pages, Paperback" /> publish date: September 21st 2011
format: paperback pages: 308
ISBN: 1461288169 (9781461288169)
Yield Modelling And Defect Tolerance In Vlsi: Papers Presented At The International Workshop On Designing For Yield, Oxford, 1 3 July 1987 - Will Moore, Wojciech Maly, Andrzej J. Strojwas
Yield Modelling And Defect Tolerance In Vlsi: Papers Presented At The International Workshop On Designing For Yield, Oxford, 1 3 July 1987
by Will Moore (author), Wojciech Maly (author), Andrzej J. Strojwas (author)
publisher: Taylor & Francis Group
format: hardcover pages: 304
language: English
ISBN: 085274398X (9780852743980)
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