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Yield Modelling And Defect Tolerance In Vlsi: Papers Presented At The International Workshop On Designing For Yield, Oxford, 1 3 July 1987 - Will Moore, Wojciech Maly, Andrzej J. Strojwas
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Yield Modelling And Defect Tolerance In Vlsi: Papers Presented At The International Workshop On Designing For Yield, Oxford, 1 3 July 1987
by: (author) (author) (author)
Format: hardcover
ISBN: 9780852743980 (085274398X)
Publisher: Taylor & Francis Group
Pages no: 304
Edition language: English
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