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Reliability, Packaging, Testing, and Characterization of Mems/Moems VI: 23-24 January, 2007, San Jose, California, USA - Society Of Photo-Optical Instrumentation, Allyson L. Hartzell, Rajeshuni Ramesham
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Reliability, Packaging, Testing, and Characterization of Mems/Moems VI: 23-24 January, 2007, San Jose, California, USA
by: (author) (author) (author)
Format: hardcover
ISBN: 9780819465764 (0819465763)
Publisher: SPIE-International Soc..." />
Edition language: English
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