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Thin Film Analysis by X-Ray Scattering - editions back

by Mario Birkholz, Paul F. Fewster, Christoph Genzel
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Thin Film Analysis by X-Ray Scattering - Mario Birkholz, Paul F. Fewster, Christoph Genzel
Thin Film Analysis by X-Ray Scattering
publisher: Wiley-VCH Verlag GmbH publish date: February 1st 2006
format: hardcover pages: 356
language: English
ISBN: 3527310525 (9783527310524)
Thin Film Analysis by X-Ray Scattering - Mario Birkholz
Thin Film Analysis by X-Ray Scattering
publisher: Wiley-VCH publish date: May 12th 2006
format: kindle pages: 378
language: English
ASIN: B009CVOERS
Thin Film Analysis by X-Ray Scattering - Mario Birkholz
Thin Film Analysis by X-Ray Scattering
publisher: Wiley-VCH Verlag GmbH publish date: January 1st 2006
format: ebook pages: 380
language: English
ISBN: 128085412X (9781280854125)
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