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Test and Diagnosis for Small-Delay Defects - Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
Test and Diagnosis for Small-Delay Defects
by: (author) (author) (author)
Format: hardcover
ISBN: 9781441982964 (1441982965)
Publisher: Springer
Pages no: 212
Edition language: English
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Other editions (2)
Test and Diagnosis for Small-Delay Defects - Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
Test and Diagnosis for Small-Delay Defects - Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
Books by Krishnendu Chakrabarty
Wafer-Level Testing and Test During Burn-In for Integrated Circuits - Sudarshan Bahukudumbi, Krishnendu Chakrabarty
Testing For Small Delay Defects In Nanoscale Cmos Integrated Circuits - Krishnendu Chakrabarty, Sandeep Kumar Goel, Sandeep K. Goel
Design-For-Test and Test Optimization Techniques for Tsv-Based 3D Stacked ICS - Brandon Noia, Krishnendu Chakrabarty
Scalable Infrastructure for Distributed Sensor Networks - Krishnendu Chakrabarty
Soc (System-On-A-Chip) Testing for Plug and Play Test Automation - Krishnendu Chakrabarty
Design Technologies for Green and Sustainable Computing Systems - Partha Pratim Pande, Amlan Ganguly, Krishnendu Chakrabarty
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs - Brandon Noia, Krishnendu Chakrabarty
Digital Microfluidic Biochips: Design Automation and Optimization - Krishnendu Chakrabarty, Tao Xu
Test and Diagnosis for Small-Delay Defects - Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Frontiers in Electronic Testing) - Krishnendu Chakrabarty
Books by Mohammad Tehranipoor
Introduction to Hardware Security and Trust - Mohammad Tehranipoor, Cliff Wang
Integrated Circuit Authentication: Hardware Trojans and Counterfeit Detection - Mohammad Tehranipoor, Hassan Salmani, Xuehui Zhang
Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) - Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect ... Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability. Frontiers in Electronic Testing, Volume 37. - Mohammad Tehranipoor
Test and Diagnosis for Small-Delay Defects - Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
Books by Ke Peng
Test and Diagnosis for Small-Delay Defects - Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
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